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专利名称：Apparatus for Preparing a Sample for
Microscopy
发明人：Paul E. Fischione,Michael F. Boccabella申请号：US14341284申请日：20140725
公开号：US20160027612A1公开日：20160128
专利附图：
摘要：An apparatus for preparing a sample for microscopy is provided that has amilling device that removes material from a sample in order to thin the sample. Anelectron beam that is directed onto the sample is present along with a detector that
detects when the electron beam has reached a preselected threshold transmittedthrough or immediately adjacent the sample. Once the detector detects the electronbeam has reached this threshold, the milling device terminates the milling process.
申请人：E.A. Fischione lnstruments, lnc.
地址：Export PA US
国籍：US
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